Moldova standards PDF
Semiconductor devices - Mechanical and climatic test methods - Part 10- Mechanical shock - device and subassembly. IEC 60749-10:2022-04(en-fr). Original standard IEC 60749-10-2022 in PDF full version. Additional info + preview on request
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Semiconductor devices - Mechanical and climatic test methods - Part 11- Rapid change of temperature - Two-fluid-bath method. CEI/IEC 60749-11:2002. Original standard IEC 60749-11-2002 in PDF full version. Additional info + preview on request
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Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method. Original standard IEC 60749-11-2002 сor1-2003 in PDF full version. Additional info + preview on request
Document status: Active
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method. Original standard IEC 60749-11-2002 сor2-2003 in PDF full version. Additional info + preview on request
Document status: Active
Semiconductor devices - Mechanical and climatic test methods - Part 12- Vibration, variable frequency. IEC 60749-12:2017-12(en-fr). Original standard IEC 60749-12-2017 in PDF full version. Additional info + preview on request
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Semiconductor devices - Mechanical and climatic test methods - Part 13- Salt atmosphere. IEC 60749-13:2018-02(en-fr). Original standard IEC 60749-13-2018 in PDF full version. Additional info + preview on request
Document status: Active