Moldova standards PDF

Semiconductor devices - Mechanical and climatic test methods - Part 38- Soft error test method for semiconductor devices with memory. IEC 60749-38:2008. Original standard IEC 60749-38-2008 in PDF full version. Additional info + preview on request

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Semiconductor devices - Mechanical and climatic test methods - Part 39- Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components. IEC 60749-39:2021-11(en-fr). Original standard IEC 60749-39-2021 in PDF full version. Additional info + preview on request

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Semiconductor devices - Mechanical and climatic test methods - Part 4- Damp heat, steady state, highly accelerated stress test (HAST). IEC 60749-4:2017-03(en-fr). Original standard IEC 60749-4-2017 in PDF full version. Additional info + preview on request

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Semiconductor devices - Mechanical and climatic test methods - Part 40- Board level drop test method using a strain gauge. IEC 60749-40:2011. Original standard IEC 60749-40-2011 in PDF full version. Additional info + preview on request

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Semiconductor devices - Mechanical and climatic test methods - Part 41- Standard reliability testing methods of non-volatile memory devices. IEC 60749-41:2020-07(en-fr). Original standard IEC 60749-41-2020 in PDF full version. Additional info + preview on request

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Semiconductor devices - Mechanical and climatic test methods - Part 42- Temperature and humidity storage. IEC 60749-42:2014-08(en-fr). Original standard IEC 60749-42-2014 in PDF full version. Additional info + preview on request

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