Belarus standards PDF

Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM). Original standard BS EN 60749-26-2014 in PDF full version. Additional info + preview on request

Document status: Replaced by

Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level. Original standard BS EN 60749-28-2017 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Semiconductor devices. Mechanical and climatic test methods - Preconditioning of non-hermetic surface mount devices prior to reliability testing. Original standard BS EN 60749-30-2005 + A1-2011 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Semiconductor devices. Mechanical and climatic test methods - Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components. Original standard BS EN 60749-39-2006 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test. Original standard BS EN 60749-5-2017 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Industrial platinum resistance thermometers and platinum temperature sensors. Original standard BS EN 60751-2008 in PDF full version. Additional info + preview on request

Document status: Replaced by STB BS EN IEC 60751-2022