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Epitaxial structures. Мethod for measuring the thickness of epitaxial silicon layers in structures of the silicon-on-sapphire type based on IR interference

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Spices. Cardamon. Specifications

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Plain bearings. Wrapped bushes. Part 4. Materials

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Organoleptic analysis. Methodology. Duo-trio test

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Acceptance conditions for copying attachments, integral or otherwise, for lathes. Testing of the accuracy

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Holders for ball-mounting of punches. Construction and dimensions

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