ISO 24173-2024 PDF

Full title and description

ISO 24173:2024 — Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction. This international standard provides guidance to obtain reliable and reproducible crystallographic orientation measurements using EBSD (electron backscatter diffraction) in scanning electron microscopes and similar microbeam instruments.

Abstract

This document describes recommended practices for specimen preparation, instrument set-up and configuration, calibration procedures, data acquisition parameters and basic data-quality checks needed to produce reproducible orientation measurements and orientation maps from EBSD analyses. It is intended to improve measurement traceability and comparability across laboratories and instruments.

General information

• Status: Published (active).
• Publication date: February 2024 (Edition 2 published 9 February 2024 in several catalogues; ISO lists publication as 2024-02).
• Publisher: International Organization for Standardization (ISO).
• ICS / categories: 71.040.50 (Physicochemical methods of analysis — microbeam analysis).
• Edition / version: Edition 2 — 2024.
• Number of pages: 40 pages (official ISO bibliographic record and national catalogues list 40 pages).

Scope

Provides guidance for generating reliable and reproducible crystallographic orientation measurements using EBSD. Topics include specimen preparation (surface finish and mounting), instrument geometry and detector positioning, calibration routines, recommended acquisition settings, data indexing and quality metrics, and basic reporting to support traceability and inter-laboratory comparison. The standard is intended for laboratory practice rather than for defining a single mandatory measurement protocol.

Key topics and requirements

• Specimen preparation: surface finish, mounting and cleaning practices to optimise EBSD pattern quality.
• Instrument configuration: recommended SEM/EBSD geometry, detector positioning and camera settings for orientation measurement.
• Calibration procedures: steps to calibrate sample-to-detector geometry and to check angular accuracy and spatial registration.
• Data-acquisition parameters: suggested step sizes, exposure/beam current trade-offs, pattern quality thresholds and indexing strategies.
• Quality assurance: metrics and checks to assess pattern quality, indexing confidence, and reproducibility of orientation results.
• Reporting and metadata: recommended minimum metadata and reporting elements to support comparability and traceability of EBSD datasets.

Typical use and users

Used by materials scientists, electron-microscopy laboratories, research groups, instrument manufacturers and quality control personnel who perform EBSD orientation measurements. Typical applications include microstructural characterization, grain-orientation mapping, texture analysis, failure analysis and research where accurate orientation data are required.

Related standards

ISO 24173:2024 replaces ISO 24173:2009 (the earlier edition). It is produced under ISO/TC 202 (microbeam analysis) and complements other standards and technical reports addressing microanalysis and electron microscopy practices and terminology (see ISO bibliographic listings and national standards bodies for nearby or companion documents).

Keywords

EBSD, electron backscatter diffraction, microbeam analysis, crystallographic orientation, orientation mapping, specimen preparation, instrument calibration, orientation measurement, microstructure, metrology.

FAQ

Q: What is this standard?

A: ISO 24173:2024 is an international guideline document titled "Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction" that provides practices for producing reliable crystallographic orientation measurements with EBSD.

Q: What does it cover?

A: It covers specimen preparation, instrument configuration and geometry, calibration procedures, data acquisition settings, quality checks and recommended reporting elements to ensure reproducible orientation measurements and maps.

Q: Who typically uses it?

A: Materials scientists, SEM/EBSD operators, microscopy facilities, instrument vendors and quality/standards personnel involved in crystallographic orientation analysis and related microstructural characterization.

Q: Is it current or superseded?

A: Current — the 2024 edition (Edition 2) was published in February 2024 and replaces the 2009 edition ISO 24173:2009.

Q: Is it part of a series?

A: It is maintained within the scope of ISO/TC 202 (microbeam analysis). While not formally a multi-part series, it sits alongside other ISO documents and national standards addressing microanalysis and electron microscopy best practice.

Q: What are the key keywords?

A: EBSD; electron backscatter diffraction; orientation measurement; microbeam analysis; crystallographic orientation; specimen preparation; calibration; orientation mapping.