ISO 3274-1996 PDF

St ISO 3274-1996

Name in English:
St ISO 3274-1996

Name in Russian:
Ст ISO 3274-1996

Description in English:

Original standard ISO 3274-1996 in PDF full version. Additional info + preview on request

Description in Russian:
Оригинальный стандарт ISO 3274-1996 в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Active

Format:
Electronic (PDF)

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
365 business days

SKU:
stiso14918

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Full title and description

Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments. This International Standard defines profile concepts and the general design and nominal characteristics of contact (stylus) instruments used to measure surface roughness and waviness, and specifies instrument properties that influence profile evaluation.

Abstract

ISO 3274:1996 sets out nominal characteristics and basic design requirements for contact (stylus) profilometers so that profile evaluation methods and existing profile-based surface texture standards can be applied in a consistent way. The document was issued with a technical corrigendum in 1998.

General information

  • Status: Withdrawn (replaced by later ISO 25178 series documents).
  • Publication date: 5 December 1996 (ISO edition 2).
  • Publisher: International Organization for Standardization (ISO).
  • ICS / categories: 17.040.30 (Measuring instruments — surface texture / roughness).
  • Edition / version: Edition 2 (1996) with Technical Corrigendum ISO 3274:1996/Cor 1:1998.
  • Number of pages: 13.

Scope

Specifies the nominal characteristics, profile definitions and general structure of contact (stylus) instruments for measuring surface texture by the profile method, and the instrument properties affecting profile evaluation (e.g., stylus tip geometry, tracing and transmission characteristics). It enables application of profile-based evaluation procedures defined in companion standards.

Key topics and requirements

  • Definitions of profile-related quantities and the general profile structure required for instrument output and evaluation.
  • Nominal metrological characteristics of contact (stylus) instruments (stylus tip radius, traverse speed/range, transmission characteristics and noise considerations).
  • Requirements for instrument design that affect profile fidelity and reproducibility (mechanical and electrical transmission, guidance, and signal conditioning).
  • Information intended to be supplied by manufacturers about instrument nominal characteristics (data sheet concept).
  • Linkage and migration of content into the later ISO 25178 series (areal/profile consolidation).

Typical use and users

Used by manufacturers of contact profilometers, calibration and metrology laboratories, quality engineers, inspection departments, and standards bodies when specifying, verifying or comparing the nominal characteristics of styli-based surface texture measuring instruments. It is also referenced by technical committees and practitioners transitioning profile-based measurement practice into modern areal surface texture frameworks.

Related standards

ISO 3274:1996 has been incorporated into and superseded by parts of the ISO 25178 series (notably ISO 25178-601:2025 for contact stylus instrument characteristics). Related historical profile-method standards include ISO 4287 / ISO 4288 (profile parameters and assessment rules), which themselves have been revised or superseded by more recent surface texture documents in the GPS suite.

Keywords

surface texture, surface roughness, profile method, contact stylus, profilometer, stylus instrument, metrological characteristics, GPS, ISO 3274, ISO 25178.

FAQ

Q: What is this standard?

A: ISO 3274:1996 is an ISO standard that specifies nominal characteristics and general design requirements for contact (stylus) instruments used to measure surface texture by the profile method.

Q: What does it cover?

A: It covers profile definitions, the general structure of stylus instruments, and the instrument properties (such as stylus tip radius, transmission and traverse characteristics) that influence profile evaluation and measurement fidelity.

Q: Who typically uses it?

A: Instrument manufacturers, calibration and metrology laboratories, quality and inspection engineers, and standards developers—anyone specifying, testing or comparing contact profilometers.

Q: Is it current or superseded?

A: ISO 3274:1996 is withdrawn and its content has been superseded and incorporated into the ISO 25178 series (notably ISO 25178-601:2025 for contact stylus instrument characteristics). Users should refer to the ISO 25178 family for the current requirements.

Q: Is it part of a series?

A: Historically it belonged to the family of surface texture/profile-method standards; its modern successor framework is the ISO 25178 series (areal and profile surface texture standards) which consolidates and updates those requirements.

Q: What are the key keywords?

A: Surface texture, profile method, roughness, waviness, stylus, profilometer, metrological characteristics, GPS, ISO 3274, ISO 25178.