Belarus standards PDF

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET). Original standard UNE-EN 62373-2006 in PDF full version. Additional info + preview on request

Document status: Active

Semiconductor devices - Time-dependent dielectric breakdown (TDDB) test for inter-metal layers. Original standard UNE-EN 62374-1-2010 in PDF full version. Additional info + preview on request

Document status: Active

Common control interface for networked digital audio and video products - Transmission over networks. Signalling (TA4). Original standard UNE-EN 62379-5-2-2014 in PDF full version. Additional info + preview on request

Document status: Active

Digital addressable lighting interface - General requirements. Control gear. Original standard UNE-EN 62386-102-2014 in PDF full version. Additional info + preview on request

Document status: Replaced by STB UNE-EN IEC 62386-102-2022

Digital addressable lighting interface - Particular requirements for control gear. Fluorescent lamps (device type 0). Original standard UNE-EN 62386-201-2015 in PDF full version. Additional info + preview on request

Document status: Active

Digital addressable lighting interface - Particular requirements for control gear. Self-contained emergency lighting (device type 1). Original standard UNE-EN 62386-202-2009 in PDF full version. Additional info + preview on request

Document status: Replaced by STB UNE-EN IEC 62386-202-2023