Moldova standards PDF

Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3- Test method for defects using photoluminescence. IEC 63068-3:2020-07(en-fr). Original standard IEC 63068-3-2020 in PDF full version. Additional info + preview on request

Document status: Active

Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4- Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence. IEC 63068-4:2022-07(en). Original standard IEC 63068-4-2022 in PDF full version. Additional info + preview on request

Document status: Active

Dedicated radionuclide imaging devices - Characteristics and test conditions - Part 1- Cardiac SPECT. IEC 63073-1:2020-10(en-fr). Original standard IEC 63073-1-2020 in PDF full version. Additional info + preview on request

Document status: Active

Superconducting AC power cables and their accessories for rated voltages from 6 kV to 500 kV - Test methods and requirements. IEC 63075:2019-02(en). Original standard IEC 63075-2019 in PDF full version. Additional info + preview on request

Document status: Active

Railway applications - Rolling stock - Electrical equipment in trolley buses - Safety requirements and current collection systems. IEC 63076:2019-09+AMD1:2023-02 CSV(en-fr). Original standard IEC 63076-2023 in PDF full version. Additional info + preview on request

Document status: Active

Good refurbishment practices for medical imaging equipment. IEC 63077:2019-11(en-fr). Original standard IEC 63077-2019 in PDF full version. Additional info + preview on request

Document status: Active