Moldova standards PDF

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors. Original standard IEC 60747-8-2010 in PDF full version. Additional info + preview on request

Document status: Active

Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs). Original standard IEC 60747-9-2007 in PDF full version. Additional info + preview on request

Document status: Replaced by St IEC 60747-9-2019

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock. Original standard IEC 60749-10-2002 in PDF full version. Additional info + preview on request

Document status: Replaced by St IEC 60749-10-2022

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock. Original standard IEC 60749-10-2002 сor1-2003 in PDF full version. Additional info + preview on request

Document status: Replaced by St IEC 60749-10-2022

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices. Original standard IEC 60749-15-2010 in PDF full version. Additional info + preview on request

Document status: Replaced by St IEC 60749-15-2020

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation. Original standard IEC 60749-17-2003 in PDF full version. Additional info + preview on request

Document status: Replaced by St IEC 60749-17-2019