ISO 11452-10-2009 PDF

Full title and description

ST ISO 11452-10:2009 — Road vehicles — Component test methods for electrical disturbances from narrowband radiated electromagnetic energy — Part 10: Immunity to conducted disturbances in the extended audio frequency range. This part defines a conducted-voltage test method and procedures to determine the immunity of automotive electronic components (power, output and low‑frequency analogue leads) to narrowband conducted disturbances in the extended audio frequency band.

Abstract

ISO 11452-10:2009 specifies a bench-level conducted voltage test for individual device-under-test (DUT) leads to evaluate immunity to continuous narrowband electric voltage waveforms in the extended audio frequency range. It sets source-impedance and current limits, describes required apparatus (signal generator, extended-range amplifier, isolation transformer, loads and monitoring instruments), gives test planning and monitoring guidance, and provides annexes with typical severity levels and verification procedures.

General information

• Status: Published (first edition).
• Publication date: 15 April 2009 (first edition, 2009‑04).
• Publisher: International Organization for Standardization (ISO).
• ICS / categories: 33.100.20 (Electromagnetic compatibility, immunity) / 43.040.10 (Electrical and electronic equipment).
• Edition / version: Edition 1 (2009).
• Number of pages: 7 (official ISO published document; national adoptions may show different pagination).

Scope

This part of ISO 11452 establishes a conducted voltage test method to determine the immunity of electronic components used in passenger cars and commercial vehicles to narrowband conducted disturbances within the extended audio frequency range. It applies to individual DUT leads (supply, output and low‑frequency analogue leads) and is intended for components with acoustic or visible display functions as well as other low‑frequency signal interfaces. The disturbance types covered are continuous narrowband voltage waveforms; the user may specify severity levels and frequency ranges for the test plan.

Key topics and requirements

• Frequency range and application: typical test range 15 Hz to 250 kHz (user may reduce range for specific situations).
• Source impedance requirements: ≤ 0.5 Ω from 15 Hz to 50 kHz and ≤ 2 Ω from 50 kHz to 250 kHz at the signal source (isolation transformer secondary).
• Apparatus and setup: audio/signal generator, extended‑range audio amplifier (low output impedance, ≥50 W or equivalent), isolation transformer, measurement instruments, non‑inductive load (recommendation: 4 Ω) and optional 100 µF capacitor where applicable.
• Current and voltage limits: injected lead current shall not exceed 1 A rms; test voltages and levels defined in the test plan and Annex A severity guidance.
• Test method: apply conducted narrowband voltages to each DUT lead individually, monitor DUT functionality and performance (audio, display, logic), step through frequency increments and record threshold/failure levels.
• Performance monitoring and classification: define acceptance criteria and use function‑performance status classification (see Annex A) to record pass/fail and observed degradations.
• Verification and calibration: include procedures to verify source impedance and signal quality across the frequency range (Annex B) and to ensure measurement accuracy.

Typical use and users

Used during component development, supplier qualification, pre‑compliance testing and troubleshooting. Typical users include automotive OEM EMC teams, electronic module suppliers, independent EMC/EMI test laboratories, R&D engineers, quality and reliability engineers, and test-house technicians who need to characterise and validate component immunity to conducted narrowband disturbances in the extended audio frequency band.

Related standards

ISO 11452 is a multi‑part series; relevant parts include ISO 11452-1 (general principles and terminology), ISO 11452-2 (absorber‑lined shielded enclosure), ISO 11452-3 (TEM cell), ISO 11452-4 (bulk current injection), ISO 11452-5 (stripline), ISO 11452-7 (direct RF power injection), ISO 11452-8 (immunity to magnetic fields) and ISO 11452-11 (reverberation chamber). Other related automotive EMC standards (for vehicle‑level and component‑level testing) and OEM‑specific EMC requirements are often used together with ISO 11452 series methods.

Keywords

ISO 11452-10, conducted immunity, extended audio frequency, automotive EMC, DUT lead injection, isolation transformer, source impedance, narrowband disturbances, component test method.

FAQ

Q: What is this standard?

A: ISO 11452-10:2009 is Part 10 of the ISO 11452 series; it specifies a conducted voltage test method to assess the immunity of automotive electronic components to narrowband conducted disturbances in the extended audio frequency range.

Q: What does it cover?

A: It covers test apparatus and setup, source impedance and current limits, test procedures for applying narrowband conducted voltages to individual DUT leads, monitoring and performance classification, and verification procedures for the test system. The disturbances addressed are continuous narrowband electric voltage waveforms typically used to represent low‑frequency conducted interference.

Q: Who typically uses it?

A: Automotive OEM EMC engineers, electronic module and component suppliers, independent EMC test laboratories, R&D and quality engineers involved in component‑level electromagnetic immunity testing.

Q: Is it current or superseded?

A: ISO 11452-10 was published as a first edition in 2009 and has been maintained as the active part 10 edition. It was the published/confirmed document through ISO review cycles; there has been no widely published superseding edition as of the standard's last confirmed review. Users should check the national or ISO catalogue for the absolute latest status before purchase or formal citation.

Q: Is it part of a series?

A: Yes. It is one part of the ISO 11452 series (Component test methods for electrical disturbances from narrowband radiated electromagnetic energy). The series contains other parts that define alternative component‑level immunity test techniques (ALSE, TEM cell, BCI, stripline, direct injection, magnetic field tests, reverberation chamber, etc.).

Q: What are the key keywords?

A: Conducted immunity, extended audio frequency, automotive EMC, narrowband disturbances, DUT lead injection, source impedance, isolation transformer, ISO 11452-10.