IEC 60749-23-2011 PDF
Name in English:
St IEC 60749-23-2011
Name in Russian:
Ст IEC 60749-23-2011
Description in English:
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23- High temperature operating life. Original standard IEC 60749-23-2011 in PDF full version. Additional info + preview on request
Description in Russian:
Изменение 1 - Полупроводниковые приборы - Методы механических и климатических испытаний - Часть 23- Срок службы при высоких температурах. Оригинальный стандарт IEC 60749-23-2011 в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Replaced by St IEC 60749-23-2025
Format:
Electronic (PDF)
Page count:
22
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
3 business days
SKU:
stiec03190
More technical details are being prepared for this document.