UNE-EN 62374-1-2010 PDF
Name in English:
STB UNE-EN 62374-1-2010
Name in Russian:
СТБ UNE-EN 62374-1-2010
Description in English:
Semiconductor devices - Time-dependent dielectric breakdown (TDDB) test for inter-metal layers. Original standard UNE-EN 62374-1-2010 in PDF full version. Additional info + preview on request
Description in Russian:
Полупроводниковые приборы - Тест на диэлектрический пробой во времени (TDDB) для межметаллических слоев. Оригинальный стандарт UNE-EN 62374-1-2010 в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Active
Format:
Electronic (PDF)
Page count:
19
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
2 business days
SKU:
stune07090
More technical details are being prepared for this document.