UNE-EN 62417-2010 PDF
Name in English:
STB UNE-EN 62417-2010
Name in Russian:
СТБ UNE-EN 62417-2010
Description in English:
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs). Original standard UNE-EN 62417-2010 in PDF full version. Additional info + preview on request
Description in Russian:
Полупроводниковые приборы. Испытания подвижных ионов для полевых транзисторов на основе металлооксидных полупроводников (MOSFET). Оригинальный стандарт UNE-EN 62417-2010 в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Active
Format:
Electronic (PDF)
Page count:
11
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
2 business days
SKU:
stune07112
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