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Nanomanufacturing. Key control characteristics - Thin-film organic/nano electronic devices. Measurements of charge carrier concentration. Original standard PD IEC TS 62607-5-3-2020 in PDF full version. Additional info + preview on request

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Nanomanufacturing. Key control characteristics - Energy band gap measurement of nanomaterials by electron energy loss spectroscopy (EELS). Original standard PD IEC TS 62607-5-4-2022 in PDF full version. Additional info + preview on request

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Nanomanufacturing. Key control characteristics - Graphene-based material. Volume resistivity: four probe method. Original standard PD IEC TS 62607-6-1-2020 in PDF full version. Additional info + preview on request

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Nanomanufacturing. Key control characteristics - Graphene-based material. Sheet resistance: Terahertz time-domain spectroscopy. Original standard PD IEC TS 62607-6-10-2021 in PDF full version. Additional info + preview on request

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Nanomanufacturing. Key control characteristics - Graphene-based material. Oxygen functional group content: Boehm titration method. Original standard PD IEC TS 62607-6-13-2020 in PDF full version. Additional info + preview on request

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Nanomanufacturing. Key control characteristics - Two-dimensional materials. Carrier concentration: Field effect transistor method. Original standard PD IEC TS 62607-6-16-2022 in PDF full version. Additional info + preview on request

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