Moldova standards PDF

Evaluation of human exposure to electromagnetic fields from short range devices (SRDs) in various applications over the frequency range 0 GHz to 300 GHz - Part 1- Fields produced by devices used for electronic article surveillance, radio frequency identification and similar systems. IEC 62369-1:2008. Original standard IEC 62369-1-2008 in PDF full version. Additional info + preview on request

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Nuclear instrumentation - Housed scintillators - Test methods of light output and intrinsic resolution. IEC 62372:2021-02(en-fr). Original standard IEC 62372-2021 in PDF full version. Additional info + preview on request

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Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1- Fast BTI test for MOSFET. IEC 62373-1:2020-07(en-fr). Original standard IEC 62373-1-2020 in PDF full version. Additional info + preview on request

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Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET). CEI/IEC 62373:2006. Original standard IEC 62373-2006 in PDF full version. Additional info + preview on request

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Semiconductor devices - Part 1- Time-dependent dielectric breakdown (TDDB) test for inter-metal layers. IEC 62374-1:2010. Original standard IEC 62374-1-2010 in PDF full version. Additional info + preview on request

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Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films. IEC 62374:2007. Original standard IEC 62374-2007 in PDF full version. Additional info + preview on request

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