STM PDF

F1526-Standard Test Method for Measuring Surface Metal Contamination on Silicon Wafers by Total Reflection X-Ray Fluorescence Spectroscopy. Original standard ASTM RR-F01-1012 1996 in PDF full version. Additional info + preview on request

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F1593-Test Method for Trace Metallic Impurities in Electronic Grade Aluminum by High Mass-Resolution Glow-Discharge Mass Spectrometer. Original standard ASTM RR-F01-1013 1996 in PDF full version. Additional info + preview on request

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Interlaboratory Study to Establish Precision Statements for ASTM F996, Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics. Original standard ASTM RR-F01-1014 1997 in PDF full version. Additional info + preview on request

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F1530-Standard Test Method for Measuring Flatness, Thickness, and Thickness Variation on Silicon Wafers by Automated Noncontact Scanning. Original standard ASTM RR-F01-1016 2000 in PDF full version. Additional info + preview on request

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F0076- Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors. Original standard ASTM RR-F01-1018 2008 in PDF full version. Additional info + preview on request

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F2360-Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source. Original standard ASTM RR-F01-1019 2008 in PDF full version. Additional info + preview on request

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