Turkmenistan standards PDF

Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method Original standard JIS H 0604-1995 in PDF full version. Additional info + preview on request

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Determination of Conductivity Type in Germanium by Thermoelectromotive Method Original standard JIS H 0607-1978 (1983) in PDF full version. Additional info + preview on request

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Test methods of crystalline defects in silicon by preferential etch techniques Original standard JIS H 0609-1999 in PDF full version. Additional info + preview on request

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Method of Measurement of Etch Pit Density of Germanium Crystal Original standard JIS H 0610-1966 (1983) in PDF full version. Additional info + preview on request

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Method for photoelectric emission spectrochemical analysis of cadmium metal Original standard JIS H 1163-2024 in PDF full version. Additional info + preview on request

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Method for determination of tellurium in copper Original standard JIS H 1064-1992 in PDF full version. Additional info + preview on request

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